A preliminary study on the clustering analysis met

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Preliminary study on patent clustering analysis methods

patent analysis methods are divided into quantitative analysis and qualitative analysis. Quantitative analysis refers to the statistics of the external characteristics of patent documents (various description items of patent documents) according to certain indicators (such as the number of patents), and the interpretation and analysis of relevant data; Qualitative analysis is an analysis process that takes the content of patents as the object, merges patent documents according to technical characteristics, and makes them orderly. Qualitative analysis generally classifies or clusters according to the content characteristics of patents, and combines time and space to carry out comparative analysis, combination analysis, correlation analysis, sequence analysis, prediction analysis, etc. patent clustering belongs to the qualitative analysis method of patents

through the correlation statistics of patent quotation data, we can find out the relevant patent clusters, judge the importance of patents, identify seed patents and peripheral patents, and also show the correlation of patents

taking nano imprint technology as an example, this paper makes a preliminary study on the patent clustering analysis method, and gives the patent clustering analysis results of nano imprint technology

I. database introduction

the citation records of patent analysis are retrieved from the Derwent Innovations Index (DII) database. Derwent innovations index is a web-based patent information database launched by Derwent. The database is produced and published by Derwent company in the UK. It is the best patent database at present and the most expensive fee based patent database in the world at present. It contains more than 10 million basic invention patents and more than 20 million patent information of metal grease from more than 40 patent agencies around the world (covering more than 100 countries), The data dates back to 1963, integrating the Derwent World Patents Index and the patents citation I's voice ndex (Patent Citation Index) with only machine operation, and providing global patent information at the rate of weekly update

II. Patent clustering research methods

1 Search the searched and screened patent families in the DiI database, and take the patent families with citation information as the statistical object of patent citation

2. Retrieve the referenced records of statistical objects in the DiI database

3. "Seed" patents are determined according to the number of citations of patents and the number of patents of the same family

4. Analyze the cited results of "seed" patents, and draw a patent citation network using Microsoft Office Visio drawing software (see Figure 1-4)

Figure 1 technology cluster 1 patent citation network figure 2 technology cluster 2 patent citation network figure 3 technology cluster 3 patent citation network figure 4 Technology Cluster 4 patent citation network figure

5 The patent clustering is analyzed according to the patent citation network

III. patent clustering analysis of nanoimprinting technology

nanoimprinting is an emerging technology. According to its technical characteristics, we comprehensively consider its retrieval strategy from the international patent classification number, keywords and major researchers. The patent content is retrieved from the dialog system 351 document Derwent world patent index (DWPI). As of May 31, 2006, 228 patent families have been retrieved (the number of patents of the same family has been merged). After expert screening, there are 208 patents related to nano imprinting

the 208 nano imprint technology patent families retrieved and screened in the DiI database were searched, and 112 patent families were found to have citation information. Therefore, these 112 patent families were taken as the statistical object of patent citation. Then, the cited numbers of 112 patents in the patent family are sorted. Among them, the two patents with the most cited numbers are the origin patent of nano imprint - US and the world patent Wo related to nano imprint demoulding materials. Take these two patents as seed patents, and carry out patent citation data correlation statistics in 112 patent families. Some characteristics of these patents are found:

Technical commonality: in these clusters, the top cited patent networks will almost always focus on several identical patents, indicating that these patents are highly relevant. From a technical point of view, they have strong intersection and commonality in some technical points

technology clustering: Although patent citations are cross cutting, some patents can still be found to have origins (such as us, wo, US, wo). According to these seed patents, nanoimprint patents can be divided into four technology clusters of different sizes

the seed patent of technology cluster 1 is the "ancestor" patent of nano imprinting - US applied by Minesota University in the United States. This patent first proposed nano imprinting technology and is also the most cited patent in the search. Therefore, there are many patents and a wide range of patents in this cluster. The cluster includes the basic patents of the United States, France, Europe, the world, Taiwan, Japan and other countries, covering many countries

the seed patent of cluster 2 is also a patent applied by nesota University. If there is this passage, it describes the continuous release material film coating used in nano imprinting. This coating includes the compounds of the following formula: release-m (x) n-1 -, release-m (x) n-m-1qm or release-m (or) n-1. From the number of patent families and countries involved in this cluster, this kind of demoulding material coating has received great attention and is widely used

cluster 3 seed patent is the patent of nano imprint template applied by Texas University. The patent introduces the forming method and use of template, as well as the supporting equipment of template. Due to the importance of templates in nano imprinting, this patent is also cited by many other nano imprinting patents

Cluster 4 takes the UV nano imprint patent Wo applied by Texas University as the seed patent. In this cluster, most patents adopt UV nano imprinting, which is also one of the promising methods in nano imprinting. The cluster is dominated by U.S. and world patents. (end)

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